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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

22.03.2022
 

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Check our our preprint on Transverse Electron Beam Shaping with Light: arxiv.org/abs/2203.07925

22.03.2022
 

Nele has a background in physics and biology and will strengthen our FLIM team for her bachelors thesis.

11.02.2022
 

Congratulations to Thomas Juffmann from the Institute of Quantum Optics, Quantum Nanophysics and Quantum Information for receiving the ERC Proof of...

18.08.2021
 

A snapshot of Rajendra Singh installing of our new Poseidon liquid cell electron microscopy system. It will allow us to study electrochemistry with...

18.08.2021
 

Hanieh is joining us for her PhD on The ONEM project!

07.07.2021
 

Our proposal is out!