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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

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27.06.2024
 

Unified Simulation Platform for Interference Microscopy
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13.06.2024
 

Growth of ultra-flat ultra-thin alkali antimonide photocathode films
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11.06.2024
 

Exhibition at the European Capitol of Culture 2024!
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11.06.2024
 

Our PhD student Hanieh Jafarian at MIT doing her secondment.

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03.06.2024
 

Our group retreat was a huge success in Prein an der Rax.

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24.05.2024
 

Quantum limits of position and polarizability estimation in the optical near field
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