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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

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18.11.2025
 

Optimizing the localization precision in coherent scattering microscopy using structured light
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18.11.2025
 

Of the 2,087 submissions, 44 projects were selected to receive an EIC Pathfinder Grant. We are involved in the CHEM-SCAN project.
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27.10.2025
 

It was our pleasure to welcome the Simons Science School to our lab.
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16.10.2025
 

Compensating spherical and chromatic aberrations of ultrafast electron microscopes with laser beams
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16.10.2025
 

We were delighted to host a symposium of VDSP PhD students at the lab.
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12.08.2025
 

Cavity-enhanced continuous-wave microscopy with potentially unstable cavity length
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