In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.


Latest News


Since the beginning of November, a 500m² large mural depicting the Austrian-British Nobel Prize winner Max Perutz and his science has just been...


Barbara will start her master’s thesis in our group and will work on iScat measurements of protein dynamics in lipids, with the goal to compare them...


Join us at the Vienna Science Festival! Togegther with the group of Prof. Haslinger (TU Wien) we will measure the speed of light riding a bike.


We are looking for a highly motivated postdoc to join the 'Optical Near-field Electron Microscopy' project.


We are proudly hosting four talented summer students this year! From left to right:


Lukas Kienesberger (LMU Munich) works on wavefront engineering...




Check our our preprint on Transverse Electron Beam Shaping with Light: arxiv.org/abs/2203.07925