In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.


Latest News

1 2 3 4

Optical Near-Field Electron Optics

Finally we can present more information on our project 'Optical Near-Field Electron Microscopy (ONEM), which aims at building a new microscope for the...


How good is your phase microscope?

Our new paper on the sensitivity limits in phase microscopy just got published!


Dorian Bouchet, Jonathan Dong, Dante Maestre, and Thomas Juffmann ...


‘Celebrating Women at the Faculty of Physics’

Clara Conrad-Billroth is co-organizing the ‘Celebrating Women at the Faculty of Physics’ online conference at the faculty of physics.


Kick-off of the 'Optical Near-field Electron Microscopy' project

Today we will have the official kick-off of our FET proactive project 'Optical Near-field Electron Microscopy (ONEM)'.


New paper on photography at the speed of light.

We finally published an article about our outreach project 'SEEC - photography at the speed of light'.


Maybe a good read for the holidays?



Jan Pac in Dean's list for best master students!

Jan was named one of the best master students of the faculty of physics in our dean's holiday speech.


Congratulations Jan!

1 2 3 4