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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

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15.11.2022
 

Since the beginning of November, a 500m² large mural depicting the Austrian-British Nobel Prize winner Max Perutz and his science has just been...
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11.10.2022
 

Barbara will start her master’s thesis in our group and will work on iScat measurements of protein dynamics in lipids, with the goal to compare them...
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25.08.2022
 

Join us at the Vienna Science Festival! Togegther with the group of Prof. Haslinger (TU Wien) we will measure the speed of light riding a bike.
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25.08.2022
 

We are looking for a highly motivated postdoc to join the 'Optical Near-field Electron Microscopy' project.

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24.08.2022
 

We are proudly hosting four talented summer students this year! From left to right:

 

Lukas Kienesberger (LMU Munich) works on wavefront engineering...
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22.03.2022
 

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Check our our preprint on Transverse Electron Beam Shaping with Light: arxiv.org/abs/2203.07925
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