In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.


Latest News

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Welcome Ilia Zykov!

Ilia is joining us from the Moscow Institute of Physics and Technology and will be working on the ONEM project.


The Austrian Science Magazine Alexandria published an interview about our outreach work making a music video at the speed of light!


Manpreet Kaur received an intradisciplinary fellowship funded by the Vienna Doctoral School of Physics.



Optical Near-Field Electron Optics

Finally we can present more information on our project 'Optical Near-Field Electron Microscopy (ONEM), which aims at building a new microscope for the...


How good is your phase microscope?

Our new paper on the sensitivity limits in phase microscopy just got published!


Dorian Bouchet, Jonathan Dong, Dante Maestre, and Thomas Juffmann ...


‘Celebrating Women at the Faculty of Physics’

Clara Conrad-Billroth is co-organizing the ‘Celebrating Women at the Faculty of Physics’ online conference at the faculty of physics.

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