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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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27.01.2026
 

Coupling free electrons to a trapped-ion quantum computer
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12.01.2026
 

Low-Energy Single-Electron Detector with Submicron Resolution
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19.11.2025
 

Congratulations to Hanieh Jafarian on winning the Quantum Tech Entrepreneurship Award!
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18.11.2025
 

Reinforcement for the Juffmann Group
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18.11.2025
 

Ivana has been awarded one of the Rectorate's prestigious Franziska Seidl scholarships.
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18.11.2025
 

Optimizing the localization precision in coherent scattering microscopy using structured light
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