About

In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

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09.10.2019
 

Full-field single molecule FLIM using Pockels Cells!

26.09.2019
 

New paper on LowPhi

Our paper 'Local Optimization of Wave-fronts for optimal sensitivity PHase Imaging (LowPhi)' is out! ...

26.09.2019
 

New paper on MPTEM design!

Our paper on the design of a 10 keV multi-pass transmission electron microscope is out! ...

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