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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

12.08.2025
 

Cavity-enhanced continuous-wave microscopy with potentially unstable cavity length

24.07.2025
 

The Juffmann group retreat 2025 was a great success!

19.05.2025
 

(Quantum) Fisher Information in Localization Microscopy

01.04.2025
 

The paper "A Snapshot of Relativistic Motion: Visualizing the Terrell Effect" was published in Nature Communications and featured in Physics World.

17.03.2025
 

Pulsed laser deposition assisted epitaxial growth of cesium telluride photocathodes for high brightness electron sources

23.01.2025
 

A structural analysis of ordered Cs3Sb films grown on single crystal graphene and silicon carbide substrates