About

In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

24.08.2018
 

Matthias Schneller will join our team for two months and will characterize our diode-pumped femtosecond laser (Coherent Monaco). Matthias has...

26.06.2018
 

Marius did his masters at the Stefan Meyer Institute working on the development of a fast timing barrel scintillator hodoscope using silicon...

16.05.2018
 

Jan will help design and build our optical multi-pass microscope. Welcome aboard!