About

In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

24.08.2018
 

Francisco is studying physics and mechanical engineering. He'll do his bachelor in our group working on active magnetic field compensation. Welcome!

24.08.2018
 

Matthias Schneller will join our team for two months and will characterize our diode-pumped femtosecond laser (Coherent Monaco). Matthias has...

26.06.2018
 

Marius did his masters at the Stefan Meyer Institute working on the development of a fast timing barrel scintillator hodoscope using silicon...