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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

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07.07.2021
 

Peter Kunnas is joining us for a postdoc on the ONEM project!

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29.06.2021
 

Our new paper compares the estimation precision concerning mass photometry and particle tracking that is achievable using interferometric imaging...
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10.06.2021
 

Ilia is joining us from the Moscow Institute of Physics and Technology and will be working on the ONEM project.

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10.06.2021
 

The Austrian Science Magazine Alexandria published an interview about our outreach work making a music video at the speed of light!
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26.04.2021
 

Manpreet Kaur received an intradisciplinary fellowship funded by the Vienna Doctoral School of Physics.

 
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04.03.2021
 

Finally we can present more information on our project 'Optical Near-Field Electron Microscopy (ONEM), which aims at building a new microscope for the...
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