04.03.2021
Finally we can present more information on our project 'Optical Near-Field Electron Microscopy (ONEM), which aims at building a new microscope for the study of interfaces. It combines non-invasive probing with light optics, with a high-resolution read-out based on electron optics.
Our proposal paper on ONEM can now be found on arxiv.
An introduction for a general audience has been released in English and in German.
