New manuscript on Optical-Near-field Electron Microscopy (ONEM)


Our proposal is out!

ONEM is new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

Our manuscript was published in Phys. Rev. Applied. You can find it here.