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In any image, the number of detected probe particles is fundamentally limited, either due to finite acquisition times or  probe-induced sample damage. In order to optimize the sensitivity of a microscope, the information that can be extracted from each detected probe particle has to be maximized.  We achieve this by employing cavity enhancement, quantum enhancement, and wave-front shaping techniques.

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Latest News

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23.01.2025
 

A structural analysis of ordered Cs3Sb films grown on single crystal graphene and silicon carbide substrates
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07.01.2025
 

Congratulations to Barbara Platzer for making the Dean's List of the Faculty of Physics!
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09.09.2024
 

We welcome Oliver Lueghamer in our group!

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06.09.2024
 

A Snapshot of Relativistic Motion: Visualizing the Terrell Effect
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20.08.2024
 

A camera in Salzkammergut captures a photo with a 1000-year long exposure time!
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01.07.2024
 

Ece İpek Saruhan has joined our group as a guest researcher for six months.

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